The sYAG beam diagnostic has been converted to a dual purpose x-ray spectrometer and profile monitor for the 2012 run.
When operating as an x-ray spectrometer, the YAG crystal intercepts x-rays produced by the beam in a half-period wiggler magnet just upstream of the sYAG diagnostic. This measurement is non-invasive and preserves beam emittance. The Cerium doped YAG crystal scintillates and is imaged by an sCMOS camera, providing valuable information about the beam's energy spread to both beam operators and experimenters.
The sYAG insert has also been equipped with a Chromium doped Aluminum profile monitor that can be inserted directly into the beamline. The profile monitor allows beam operators to directly image the transverse beam profile at the end of the W-chicane.